Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 163 (Advances in Imaging & Electron Physics #163) (Hardcover)

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Product Details ISBN: 9780123813145
ISBN-10: 012381314X
Publisher: Academic Press
Publication Date: July 26th, 2010
Pages: 248
Language: English
Series: Advances in Imaging & Electron Physics